Atomic Force Microscopy (AFM): High-Resolution Imaging and Measurement at the Nanoscale
Atomic Force Microscopes (AFMs) are powerful analytical instruments used to image, measure, and manipulate materials at the nanometer and even atomic scale. Unlike traditional optical microscopes, which are limited by the wavelength of light, AFMs rely on mechanical interactions between a sharp probe and a sample surface. Since their invention in the 1980s, AFMs have become essential tools in nanotechnology, materials science, semiconductor research, life sciences, and surface engineering. The core working principle of an Atomic Force Microscope involves a nanoscale sharp tip mounted on a flexible cantilever. As the tip scans across the sample surface, it experiences forces such as van der Waals forces, electrostatic forces, or chemical bonding interactions. These forces cause the cantilever to deflect slightly. A laser beam reflected off the cantilever into a photodetector measures this deflection with extremely high precision. The collected data is then converted into a three-dimens...